Recipe‑based automation for atomic force microscopy (AFM) workflows ensures consistent, repeatable data acquisition, reduces operator dependency, and streamlines complex measurement routines. Bruker’s AutoMET automation software, widely adopted for conventional AFM characterization, now also brings automation to nanoscale IR (nanoIR) spectroscopy and imaging. AutoMET provides exceptional ease of use and adaptability for critical‑to‑quality measurements in production, QA/QC, or other high‑volume metrology applications, such as machine learning–based studies.
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